The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2018

Filed:

Jun. 16, 2014
Applicant:

Palantir Technologies Inc., Palo Alto, CA (US);

Inventors:

Feridun Arda Kara, New York, NY (US);

Eli Bingham, New York, NY (US);

John Garrod, Palo Alto, CA (US);

Daniel Erenrich, Mountain View, CA (US);

Anirvan Mukherjee, Mountain View, CA (US);

Ted Mabrey, New York, NY (US);

Andrew Ash, Menlo Park, CA (US);

Zachary Bush, Palo Alto, CA (US);

Allen Cai, Menlo Park, CA (US);

Winnie Chai, Los Altos, CA (US);

Greg Cohan, Newton, MA (US);

Chris Dorsey, San Francisco, CA (US);

William Dwyer, Palo Alto, CA (US);

Gilad Gray, Redwood City, CA (US);

Sean Kelley, San Francisco, CA (US);

Dennis Kwon, Fort Lee, NJ (US);

Chris Lewis, East Palo Alto, CA (US);

Greg Martin, Royal Oak, MI (US);

Parvathy Menon, San Francisco, CA (US);

Brian Ngo, San Francisco, CA (US);

Asli Ozyar, Palo Alto, CA (US);

Mike Reilly, New York, NY (US);

Jacob Scott, Berkeley, CA (US);

Ankit Shankar, Millbrae, CA (US);

Matt Sills, San Francisco, CA (US);

Spencer Stamats, Palo Alto, CA (US);

Geoff Stowe, San Francisco, CA (US);

Samir Talwar, London, GB;

Engin Ural, Brooklyn, NY (US);

Patricio Jones Velez, Palo Alto, CA (US);

Holt Wilkins, New York, NY (US);

Diane Wu, Palo Alto, CA (US);

Drausin Wulsin, New York, NY (US);

Di Wu, Palo Alto, CA (US);

Yu-Hsin Joyce Chen, Palo Alto, CA (US);

Baris Kaya, Istanbul, TR;

Assignee:

Palantir Technologies Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06Q 10/06 (2012.01);
U.S. Cl.
CPC ...
G06F 17/30554 (2013.01); G06F 17/30572 (2013.01); G06F 17/30598 (2013.01); G06Q 10/0639 (2013.01);
Abstract

Systems and methods are provided for analyzing entity performance. In one implementation, a method is provided that includes recognizing an identifier associated with an entity and accessing a data structure comprising information associated with a plurality of interactions. The method also comprises identifying one or more interactions of the plurality of interactions based on the recognized identifier. The method further comprises processing the information of the identified interactions to analyze a performance of the entity and providing the processed information to display the performance of the entity on a user interface.


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