The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2018
Filed:
Dec. 19, 2014
Palo Alto Research Center Incorporated, Palo Alto, CA (US);
Mark J. Stefik, Portola Valley, CA (US);
Daniel G. Bobrow, Palo Alto, CA (US);
Hoda Eldardiry, San Carlos, CA (US);
Robert T. Krivacic, San Jose, CA (US);
Pai Liu, Sunnyvale, CA (US);
Sureyya Tarkan, Palo Alto, CA (US);
Edward Wu, San Jose, CA (US);
Conduent Business Services, LLC, Florham Park, NJ (US);
Abstract
A computer-implemented method for analyzing organizational performance from episodic data is provided. Event objects for events is maintained in a database. A trigger for notifying beginning of an event is received. An event object is generated in response to the trigger. Activity data is created for the event object and each of the activity data includes notes of a subjective nature having received and messages of an objective nature. Each of the activity data is associated with event tags. Each of the event objects is classified in an event class and the event class includes a pattern of parameters. Analytics of the event objects is performed based on the event tags and the event class. Filters received from a reviewer is defined for search. A list of the analytics of the event objects which pattern of parameters matches with the filters is displayed on a display.