The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2018
Filed:
Mar. 27, 2015
Kabushiki Kaisha Toshiba, Minato-ku, JP;
Toshiba Solutions Corporation, Kawasaki-shi, JP;
Kazuyoshi Nishi, Fuchu, JP;
Shigeru Matsumoto, Nishitokyo, JP;
Shozo Isobe, Kawasaki, JP;
Hideki Iwasaki, Fuchu, JP;
Shigeaki Sakurai, Tokyo, JP;
Kyoko Makino, Kawasaki, JP;
Rumi Hayakawa, Yokohama, JP;
Seiji Egawa, Fuchu, JP;
KABUSHIKI KAISHA TOSHIBA, Minato-ku, JP;
TOSHIBA SOLUTIONS CORPORATION, Kawasaki-shi, JP;
Abstract
A data analyzing apparatus of an embodiment generates a format variation, analytical algorithm name, and analytical parameter not stored in a first storage device, and executes analysis. The data analyzing apparatus determines whether the application accuracy is lower than the knowledge model accuracy. If the determination result is 'not lower', the data analyzing apparatus reactivates a format variation generating device and an analytical parameter generating device. If the determination result is 'lower', the data analyzing apparatus reads out a format variation and knowledge model name associated with the highest priority order in the first storage device, and executes analysis.