The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2018

Filed:

Aug. 08, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Jay S. Bryant, Rochester, MN (US);

James E. Carey, Rochester, MN (US);

Zachary A. Hill, Muskegon, MI (US);

Kendall J. Nelson, St. Paul, MN (US);

Lucas A. Palm, Rochester, MN (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06F 11/14 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1451 (2013.01); G06F 11/079 (2013.01); G06F 11/0709 (2013.01); G06F 11/0712 (2013.01); G06F 11/0751 (2013.01); G06F 11/0787 (2013.01); G06F 11/1464 (2013.01); G06F 11/1469 (2013.01); G06F 2201/805 (2013.01); G06F 2201/815 (2013.01); G06F 2201/84 (2013.01); G06F 2201/85 (2013.01);
Abstract

Determining a time for on-demand snapshotting of a virtual machine in a node prior to a failure point in a system comprising a plurality of nodes. Failure data is collected from a set of failed nodes of the plurality of nodes in a system. A failure pattern of the node is identified based on the failure data and monitoring the plurality of nodes for the failure pattern to determine that a first node of the plurality of nodes is exhibiting the failure pattern. Responsive to the determination that the first node is exhibiting the failure pattern, capturing a snapshot of a virtual machine corresponding to the first node.


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