The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2018
Filed:
Mar. 31, 2015
Tlv Co., Ltd., Kakogawa, JP;
Kenta Ihara, Kakogawa, JP;
Yoshio Miyamae, Kakogawa, JP;
TLV Co., Ltd., Hyogo, JP;
Abstract
A risk evaluation system includes a storage unit, an operation unit, a calculation unit, a risk evaluation unit and a display unit. The calculation unit calculates first and second factors for use in risk evaluation relating to specific constituent devices on the basis of predetermined information about the specific constituent devices. The risk evaluation unit generates risk evaluation information to be used for displaying a device risk evaluation matrix defined by two axes of the first factor and the second factor and including plot images plotted based on the first and second factors of the specific constituent devices. Further, the risk evaluation unit generates the device risk evaluation information in identifiable displaying mode to allow identification of plot images of specific constituent devices constituting a same process.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile