The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2018

Filed:

Jun. 24, 2016
Applicants:

Takenori Oku, Tokyo, JP;

Hiroshi Nishida, Kanagawa, JP;

Kentaro Seo, Tokyo, JP;

Shunsuke Hayashi, Kanagawa, JP;

Yusuke Shibata, Tokyo, JP;

Yuuta Sano, Tokyo, JP;

Satoshi Mizuno, Tokyo, JP;

Takeyoshi Sekine, Tokyo, JP;

Fumihiro Nagano, Kanagawa, JP;

Satoshi Hatanaka, Kanagawa, JP;

Kenji Ueda, Kanagawa, JP;

Inventors:

Takenori Oku, Tokyo, JP;

Hiroshi Nishida, Kanagawa, JP;

Kentaro Seo, Tokyo, JP;

Shunsuke Hayashi, Kanagawa, JP;

Yusuke Shibata, Tokyo, JP;

Yuuta Sano, Tokyo, JP;

Satoshi Mizuno, Tokyo, JP;

Takeyoshi Sekine, Tokyo, JP;

Fumihiro Nagano, Kanagawa, JP;

Satoshi Hatanaka, Kanagawa, JP;

Kenji Ueda, Kanagawa, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); H04N 1/00 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/0733 (2013.01); G06F 11/0793 (2013.01); H04N 1/00015 (2013.01); H04N 1/00029 (2013.01); H04N 1/00039 (2013.01); H04N 1/00061 (2013.01); H04N 1/00079 (2013.01);
Abstract

An information processing system includes a storage unit that stores and associates a cause of a failure that has occurred in an electronic device, state information of the electronic device at the time the failure has occurred in the electronic device due to the cause of the failure, and a measure to be implemented in response to the cause of the failure. The information processing system further includes at least one processor that performs an acquisition process for acquiring the state information of the electronic device, and a failure diagnosis process for determining the cause of the failure that has occurred in the electronic device and the measure to be implemented in response to the cause of the failure based on the acquired state information of the electronic device.


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