The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2018
Filed:
Apr. 03, 2017
Canon Kabushiki Kaisha, Tokyo, JP;
Kazumi Kimura, Toda, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
An optical scanning apparatus of the present invention includes: a splitting element which splits a light flux emitted from a light source into first and second light fluxes; a deflecting unit which deflects the first and second light fluxes to scan first and second scanned surfaces in a main scanning direction; and an imaging optical system which includes a first imaging lens on which both the first and second light fluxes deflected by the deflecting unit are incident and guides the first and second light fluxes to the first and second scanned surfaces. The condition expressed by −1.1≤α1/α2≤−0.9 is satisfied where α1 and α2 are angles within a main scanning cross section between a first axis parallel to the main scanning cross section and directions of incidence of the first and second light fluxes on the deflecting unit, respectively.