The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2018

Filed:

May. 19, 2015
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventor:

Junichi Wakabayashi, Matsumoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/1335 (2006.01); G02B 3/00 (2006.01); G02B 27/02 (2006.01);
U.S. Cl.
CPC ...
G02F 1/133526 (2013.01); G02B 3/0068 (2013.01); G02F 1/133512 (2013.01); G02B 3/0056 (2013.01); G02B 27/026 (2013.01); G02F 1/133504 (2013.01); G02F 2001/133507 (2013.01);
Abstract

A microlens array substrate includes a substrate, a first microlens that is disposed on a face of the substrate, a first light-transmissive layer that is disposed to cover the first microlens, a second microlens that is disposed on the intermediate layer and is arranged to overlap with the first microlens in a planar view, and a second light-transmissive layer that is disposed to cover the second microlens. A first flat portion is disposed between the first microlenses that neighbor each other at a vertex. A second flat portion is disposed between the second microlenses that neighbor each other at a vertex. The first flat portion and the second flat portion are arranged in order for at least a part of the first flat portion and a part of the second flat portion to overlap with each other in a planar view.


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