The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2018
Filed:
Oct. 08, 2015
Applicant:
Biotek Instruments, Inc., Winooski, VT (US);
Inventors:
Ben Norris, Williston, VT (US);
Ben Knight, Shelburne, VT (US);
James Piette, Winooski, VT (US);
Joe Tobey, Essex, VT (US);
Eddy Delpierre, La Chapelle Gauthier, FR;
Assignee:
BIOTEK INSTRUMENTS, INC., Winooski, VT (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/24 (2006.01); H04N 5/232 (2006.01); G02B 7/38 (2006.01);
U.S. Cl.
CPC ...
G02B 21/244 (2013.01); G02B 7/38 (2013.01); H04N 5/23212 (2013.01);
Abstract
Optimized automatic focusing of a microscope objective based on a cross correlation between a representative focus metric scan and a focus metric scan of a sample to be imaged.