The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2018

Filed:

Mar. 15, 2017
Applicant:

Nanoprecision Products, Inc., El Segundo, CA (US);

Inventors:

Robert Ryan Vallance, Newbury Park, CA (US);

Gregory L. Klotz, La Verne, CA (US);

Rand D. Dannenberg, Newbury Park, CA (US);

Assignee:

NANOPRECISION PRODUCTS, INC., El Segundo, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/42 (2006.01); G02B 6/124 (2006.01); G02B 6/12 (2006.01);
U.S. Cl.
CPC ...
G02B 6/4225 (2013.01); G02B 6/124 (2013.01); G02B 6/4214 (2013.01); G02B 6/4249 (2013.01); G02B 2006/12104 (2013.01);
Abstract

Optical alignment of optical subassembly and optoelectronic device is achieved using an external source and an external receiver, passing optical signal through a passive waveguide in the optoelectronic device, via alignment reflective surface features provided on the optical subassembly. The optical subassembly is provided with a first alignment reflective surface directing alignment signal from the source to a grating coupler at the input of the waveguide, and a second alignment reflective surface directing to the receiver the alignment signal directed from a grating coupler at the output of the waveguide after the alignment signal has been transmitted from the input to the output through the waveguide. By adjusting the relative position between the optical subassembly and the optoelectronic device, and detecting the maximum optical power of the alignment signal reflected from the second alignment reflective surface, the position of best optical alignment of the optical subassembly and the optoelectronic device can be determined.


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