The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2018

Filed:

Dec. 12, 2017
Applicants:

Yves Painchaud, Quebec, CA;

Alexandre D. Simard, Quebec, CA;

Inventors:

Yves Painchaud, Quebec, CA;

Alexandre D. Simard, Quebec, CA;

Assignee:

Ciena Corporation, Hanover, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 6/26 (2006.01); G02B 6/28 (2006.01); G01B 9/02 (2006.01); G02B 6/125 (2006.01); G02F 1/01 (2006.01); G02B 6/12 (2006.01);
U.S. Cl.
CPC ...
G02B 6/2813 (2013.01); G01B 9/02097 (2013.01); G02B 6/125 (2013.01); G02F 1/011 (2013.01); G02B 2006/12159 (2013.01);
Abstract

An optical interferometer based on multi-mode interference (MMI) devices includes an input port, an output port, a first MMI device connected to the input port at an input face of the first MMI device, a second MMI device connected to the first output port at an output face of the second MMI device. In the optical interferometer, an output face of the first MMI device and an input face of the second MMI device are directly connected, the first MMI device includes a first and a second self-imaging points at an interface between the first MMI device and the second MMI device, and a propagation axis of the second MMI device is tilted with respect to a propagation axis of the first MMI device, causing a path length difference between an upper optical path via the first self-imaging point and a lower optical path via the second self-imaging point.


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