The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2018

Filed:

Nov. 27, 2015
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Kimio Nagasaka, Hokuto, JP;

Mitsutoshi Miyasaka, Suwa, JP;

Satoshi Takahashi, Komae, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/26 (2006.01); A61B 5/00 (2006.01); A61B 5/05 (2006.01); G01R 33/032 (2006.01); A61B 5/04 (2006.01);
U.S. Cl.
CPC ...
G01R 33/26 (2013.01); G01R 33/0322 (2013.01); A61B 5/04005 (2013.01);
Abstract

In a magnetic field measurement apparatus, a light source irradiates a gas cell with linearly polarized light serving as pump light and probe light in a Z axis direction, and a magnetic field generator applies alternating magnetic fields which have the same cycle and different phases to the gas cell in each of X axis and Y axis directions. A calculation controller calculates a magnetic field C (C, C, C) of a measurement region using X axis and Y axis components Aand Aof the alternating magnetic fields, and a spin polarization degree Mcorresponding to a measurement value Wfrom a magnetic sensor.


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