The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2018

Filed:

Sep. 22, 2014
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Kunihiko Tsunedomi, Tokyo, JP;

Masahiro Watanabe, Tokyo, JP;

Tsukasa Oonishi, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05F 1/14 (2006.01); G01R 21/133 (2006.01); G06Q 50/06 (2012.01); H02J 13/00 (2006.01); G01R 19/25 (2006.01); G01R 21/00 (2006.01);
U.S. Cl.
CPC ...
G01R 21/1331 (2013.01); G01R 19/2513 (2013.01); G01R 21/003 (2013.01); G06Q 50/06 (2013.01); H02J 13/001 (2013.01); H02J 13/0079 (2013.01); Y04S 10/40 (2013.01);
Abstract

To provide a power system analysis support system in which the amount of data to be sent from a measuring device to an analysis support apparatus can be reduced. A measuring device includes a measuring unit which performs measurement related to a power system, a storage unit which stores measurement values measured by the measuring unit, a parameter generator which generates a predetermined parameter indicating a probability density function of the measurement value from the plurality of measurement values stored in the storage unit, and a communication unit which sends the predetermined parameter generated by the parameter generator to an analysis support apparatus. The analysis support apparatus includes a communication unit which receives the predetermined parameter from the measuring device, and a probability density function generator which generates a probability density function of the measurement value from the received predetermined parameter.


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