The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2018
Filed:
Aug. 08, 2014
Applicant:
Empire Technology Development Llc, Wilmington, DE (US);
Inventor:
Yansong Gu, Bellevue, WA (US);
Assignee:
EMPIRE TECHNOLOGY DEVELOPMENT LLC, Wilmington, DE (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/46 (2006.01); G01N 33/06 (2006.01); G01N 21/25 (2006.01);
U.S. Cl.
CPC ...
G01N 33/06 (2013.01); G01N 21/255 (2013.01); G01N 2201/0627 (2013.01); G01N 2201/1293 (2013.01);
Abstract
A method for the quality control of dairy products is disclosed. The method includes scanning the surface of a dairy product test sample using a chromatic scanner system to generate a spectral pattern of reflected light intensities, which pattern is unique to the test sample. The spectral pattern from the test sample is compared with spectral patterns from one or more reference dairy products to provide an indication of test sample identify, quality and/or nutritional content.