The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2018

Filed:

May. 14, 2014
Applicants:

Kyoto University, Kyoto-shi, Kyoto, JP;

Hamamatsu Photonics K.k., Hamamatsu-shi, Shizuoka, JP;

Inventors:

Junichi Imanishi, Kyoto, JP;

Masakazu Katsumata, Hamamatsu, JP;

Yuko Kobayashi, Hamamatsu, JP;

Assignees:

KYOTO UNIVERSITY, Kyoto-shi, Kyoto, JP;

HAMAMATSU PHOTONICS K.K., Hamamatsu-shi, Shizuoka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/00 (2006.01); G01N 21/64 (2006.01); G01N 21/63 (2006.01);
U.S. Cl.
CPC ...
G01N 33/0098 (2013.01); G01N 21/6408 (2013.01); G01N 2021/635 (2013.01); G01N 2021/6484 (2013.01); G01N 2201/0221 (2013.01);
Abstract

The present invention discloses a method for evaluating vitality of a plant including (a) a step of measuring a delayed luminescence of a leaf of each plant of a group of plants subject to evaluation to obtain data of delayed luminescence amount, and (b) a step of processing data of a plurality of delayed luminescence amounts thus obtained to evaluate a plant exhibiting a delayed luminescence amount not less than a preset upper limit threshold as an individual of poor growth or evaluate a plant exhibiting a delayed luminescence amount not more than a preset lower limit threshold as an individual of good growth, and a measurement system and an evaluation system used for the method.


Find Patent Forward Citations

Loading…