The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2018

Filed:

Feb. 07, 2014
Applicant:

Shimadzu Corporation, Kyoto-shi, Kyoto, JP;

Inventors:

Kumiko Jingu, Kyoto, JP;

Masanori Fujiwara, Kyoto, JP;

Masami Tomita, Kyoto, JP;

Yutaka Kono, Kyoto, JP;

Assignee:

SHIMADZU CORPORATION, Kyoto-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/41 (2006.01); G01N 30/74 (2006.01);
U.S. Cl.
CPC ...
G01N 21/4133 (2013.01); G01N 30/74 (2013.01); G01N 2021/4146 (2013.01);
Abstract

A differential refractometer including a measurement section for measuring the diffractive index difference between a sample cell and a reference cell by radiating light on a measurement cell and detecting light which has sequentially passed through the sample cell and the reference cell includes a mobile phase supply section for delivering a mobile phase in a sample introduction channel that is connected to the sample cell. The mobile phase supply section includes a mobile phase container for containing the mobile phase. The inside of the mobile phase container is continuously stirred by a stirring mechanism, and the composition of the mobile phase inside the mobile phase container is made uniform.


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