The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2018
Filed:
May. 04, 2015
Applicant:
Spectrasensors, Inc., Rancho Cucamonga, CA (US);
Inventors:
Alfred Feitisch, Los Gatos, CA (US);
Peter Dorn, Rancho Cucamonga, CA (US);
James Tedesco, Ann Arbor, MI (US);
Xiang Liu, Rancho Cucamonga, CA (US);
Assignee:
SpectraSensors, Inc., Rancho Cucamonga, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01N 21/39 (2006.01); G01N 21/3504 (2014.01); G01N 21/03 (2006.01); G01J 3/02 (2006.01);
U.S. Cl.
CPC ...
G01N 21/39 (2013.01); G01J 3/0208 (2013.01); G01N 21/031 (2013.01); G01N 21/3504 (2013.01); G01N 2021/399 (2013.01); G01N 2201/0612 (2013.01); G01N 2201/0633 (2013.01);
Abstract
A spectrometer includes a light source configured to emit a beam along a beam path through a sample volume comprising an analyte. Also included is at least one detector positioned to detect at least a portion of the beam emitted by the light source, and at least one reflector positioned along the beam path intermediate the light source and the at least one detector having a surface roughness greater than a predefined level such as 20 Å RMS.