The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2018

Filed:

Feb. 19, 2016
Applicant:

Maxim Integrated Products, Inc., San Jose, CA (US);

Inventors:

Alessandro Rocchi, Rosignano Solvay, IT;

Eleonora Marchetti, Montecatini-Terme, IT;

Lorenzo Bertini, Pisa, IT;

Assignee:

Hanking Electronics, Ltd., Canton, OH (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01C 19/56 (2012.01); G01C 19/04 (2006.01); G01C 19/5712 (2012.01); G01C 19/5747 (2012.01);
U.S. Cl.
CPC ...
G01C 19/5712 (2013.01); G01C 19/04 (2013.01); G01C 19/5747 (2013.01); Y10T 74/1293 (2015.01);
Abstract

A micromechanical sensor that can detect shock effects in order to prevent false measurements. The sensor includes a substrate having a measurement axis and a detection axis that are disposed orthogonally to each other, and first and second driving masses disposed in a plane containing the measurement and detection axes. Each of the driving masses is rotatably coupled to the substrate via a central suspension disposed on the detection axis. The sensor includes drive electrodes that generate rotary motions in each of the driving masses about a drive axis thereof. At least one elastic connecting element allows the driving masses to deflect in opposite directions in response to a rate of rotation about the measurement axis but deflect in the same direction in response to a shock condition.


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