The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2018

Filed:

May. 19, 2016
Applicant:

Carl Zeiss Industrielle Messtechnik Gmbh, Oberkochen, DE;

Inventors:

Dominik Seitz, Schwaebisch Gmuend, DE;

David Hoecherl, Aalen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01B 11/00 (2006.01); G01B 5/008 (2006.01);
U.S. Cl.
CPC ...
G01B 11/005 (2013.01); G01B 5/008 (2013.01);
Abstract

A measuring machine (), in particular a coordinate measuring machine, has at least one optical sensor () for recording an image in an image capturing region () during an image recording time period (), a control signal transducer () which provides a control signal that represents the image recording time period (), a measurement illumination arrangement () for illuminating the image capturing region (), and a control device (). The control device () is configured to switch on the measurement illumination arrangement () during the image recording time period () in a manner dependent on the control signal. The control device is further configured to switch on at least one further illumination arrangement () temporally outside of the image recording time period () in a manner dependent on the control signal. A corresponding measurement system and method for controlling the illumination are also discussed.


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