The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2018
Filed:
Jul. 17, 2015
Applicant:
Heliae Development Llc, Gilbert, AZ (US);
Inventor:
Frank Mars, McLean, VA (US);
Assignee:
Heliae Development LLC, Gilbert, AZ (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12M 1/00 (2006.01); C12M 1/12 (2006.01); C12M 1/18 (2006.01); C12M 1/02 (2006.01); C12M 1/34 (2006.01); C12M 1/36 (2006.01);
U.S. Cl.
CPC ...
C12M 21/02 (2013.01); C12M 23/06 (2013.01); C12M 23/22 (2013.01); C12M 23/58 (2013.01); C12M 29/18 (2013.01); C12M 31/02 (2013.01); C12M 31/10 (2013.01); C12M 41/18 (2013.01); C12M 41/26 (2013.01); C12M 41/48 (2013.01);
Abstract
Systems and methods are disclosed for continuously optimizing the profile of an aqueous culture comprising microorganisms. The systems and methods comprise a controlled environment comprising a housing enclosing a lighting device and controlled temperature environment, and sensor modules for measuring culture and environment parameters. The sensor modules may be in communication with an automated computer control system to continuously optimize the microorganism culture profile.