The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2018
Filed:
Oct. 22, 2014
Hitachi, Ltd., Tokyo, JP;
Yushi Tsubota, Tokyo, JP;
Fumito Watanabe, Tokyo, JP;
Yasutaka Konno, Tokyo, JP;
Shinichi Kojima, Tokyo, JP;
Keisuke Yamakawa, Tokyo, JP;
Shinji Kurokawa, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A change of X-ray radiation quality due to a material existing between an X-ray source and a detection element is estimated and corrected. Accordingly, deterioration of material discrimination ability in a dual energy imaging method can be prevented. An X-ray imaging apparatus is provided with an inherent filtration calculator configured to use measured data obtained by imaging air at two or more types of different tube voltages to calculate a deviation from a reference radiation quality, as a transmission length (inherent filtration) of a predetermined reference material. A reference-material transmission-length conversion is applied to the measured data according to the dual energy imaging method, thereby calculating the reference material transmission length (inherent filtration). When a subject is imaged, the dual energy imaging is performed by adding the inherent filtration calculated as to each detection element, and this produces an image with the change of radiation quality having been corrected.