The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2018
Filed:
Jul. 22, 2016
Applicant:
Renesas Electronics Corporation, Tokyo, JP;
Inventor:
Shunsuke Kizuna, Tokyo, JP;
Assignee:
Renesas Electronics Corporation, Koutou-ku, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/10 (2006.01); H04N 5/357 (2011.01); H03M 1/08 (2006.01); H04N 5/378 (2011.01); H04N 17/00 (2006.01); H03M 1/12 (2006.01);
U.S. Cl.
CPC ...
H04N 5/3577 (2013.01); H03M 1/08 (2013.01); H04N 5/378 (2013.01); H04N 17/002 (2013.01); H03M 1/12 (2013.01);
Abstract
In semiconductor devices according to related art, it is impossible to sufficiently evaluate column ADC interference. According to one embodiment, a semiconductor device includes a plurality of analog/digital conversion circuits that are arranged in a column direction of a pixel array and convert a pixel output signal output from the pixel array for each row into a digital value, and a conversion signal selection circuit that selects one of the pixel output signal and a test signal having a test voltage for each analog/digital conversion circuit according to a test pattern and outputs the selected signal.