The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2018
Filed:
Mar. 18, 2013
Applicants:
Nec Corporation, Tokyo, JP;
National Institute of Information and Communications Technology, Tokyo, JP;
Inventors:
Assignees:
NEC CORPORATION, Tokyo, JP;
NATIONAL INSTITUTE OF INFORMATION AND COMMUNICATIONS TECHNOLOGY, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/217 (2011.01); G01N 21/3581 (2014.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
H04N 5/217 (2013.01); G01N 21/3581 (2013.01); G01N 21/8806 (2013.01); G01N 21/8851 (2013.01);
Abstract
A sample is irradiated with terahertz light from a light source, so that an image (G1) is generated by capturing an image of a region (R1) including a point (S) of the sample, and an image (G2) is generated by capturing an image of a region (R2) including the point (S) and separated from the region (R1) by a distance (L). A single image (V) is generated by applying a predetermined binary operation to the images (G1) and (G2).