The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2018
Filed:
Mar. 16, 2016
Hitachi, Ltd., Tokyo, JP;
Atsushi Iwamura, Tokyo, JP;
Yoshiko Yasuda, Tokyo, JP;
Hideaki Tsushima, Tokyo, JP;
Hideaki Ishii, Tokyo, JP;
Atsushi Komatsuzawa, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
The failure isolation method includes: a first step of performing a predetermined action for the monitoring target, collecting a failure event which is a result of the action, applying the failure event to a failure cause analysis rule, and narrowing down the root cause events together with certainty factors; a second step of determining whether the root cause event and the certainty factor narrowed down in the first step satisfy a predetermined requirement and whether the narrowing-down has been completed; and a third step of, when it is determined in the second step that the narrowing-down has not been completed, performing a predetermined additional action for the monitoring target, collecting an additional failure event which is a result of the additional action, applying the additional failure event to the failure cause analysis rule, and narrowing down the root cause events together with the certainty factors.