The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2018
Filed:
May. 20, 2016
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Alexander Roth, Dorfen, DE;
Wolfgang Wendler, Groebenzell, DE;
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Abstract
A measuring system comprises a noise source adapted to provide a noise signal to a device under test. Moreover, it comprises a measuring device adapt to measure a measuring signal generated by the device under test in reaction to the noise signal. The measuring device further comprises a signal splitter adapted to split the measuring signal into at least a first split measuring signal and a second split measuring signal. Moreover it comprises a correlator adapted to correlate a signal derived from the first split measuring signal and a signal derived from the second split measuring signal. Also the measuring device comprises a processor adapted to determine an amplification factor and/or a noise figure of the device under test based upon the correlated signal derived from the first split measuring signal and signal derived from the second split measuring signal.