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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10020328 B1

PDFFull Text
Date of Patent:
Jul. 10, 2018

Filed:

Oct. 19, 2016

Test element unit, array substrate, display panel, display apparatus, and method of manufacturing array substrate

Applicant:

Boe Technology Group Co., Ltd., Beijing, CN;

Inventors:

Yu-Cheng Chan, Beijing, CN;

Shuai Zhang, Beijing, CN;

Qi Liu, Beijing, CN;

Assignee:

BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;

Attorney:

Westman, Champlin & Koehler, P.A.

Primary Examiner:

Yosef Gebreyesus

Int. Cl.
CPC ...
H01L 23/58 (2006.01); H01L 27/12 (2006.01); H01L 21/66 (2006.01); H01L 29/786 (2006.01);
U.S. Cl.
CPC ...
H01L 27/1296 (2013.01); H01L 22/12 (2013.01); H01L 22/34 (2013.01); H01L 27/124 (2013.01); H01L 27/1222 (2013.01); H01L 27/1251 (2013.01); H01L 27/1255 (2013.01); H01L 29/78675 (2013.01);
Abstract

The present disclosure provides a test element unit, an array substrate, a display panel, a display apparatus and a corresponding manufacturing method. The test element unit includes: a plurality of layers of test patterns, each layer of test pattern including at least one test block and at least one capacitor being formed between test blocks located in different layers, and, two electrodes of each of capacitors being two test blocks located in different layers, respectively, so that it can determined whether or not corresponding components and devices formed in the display region meet requirements by detecting the test patterns formed in the test region.

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Chan, Yu-Cheng. (2018). Test element unit, array substrate, display panel, display apparatus, and method of manufacturing array substrate (U.S. Patent No. 10020328). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10020328

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