The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 2018

Filed:

Mar. 31, 2017
Applicant:

Shimadzu Corporation, Kyoto-shi, Kyoto, JP;

Inventors:

Xiaoqiang Zhang, Shanghai, CN;

Yunqing Huang, Shanghai, CN;

Wenjian Sun, Shanghai, CN;

Assignee:

SHIMADZU CORPORATION, Kyoto-Shi, Kyoto, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); G01N 27/62 (2006.01);
U.S. Cl.
CPC ...
H01J 49/009 (2013.01); G01N 27/624 (2013.01); H01J 49/005 (2013.01); H01J 49/0036 (2013.01);
Abstract

A method for parallel analysis in mass spectrometry and ion mobility spectrometry includes enabling a sample to be subjected to a chromatography separation; ionizing the chromatography separated sample and then feeding the sample into a succeeding stage device for analysis, comprising: analyzing at least part of the ionized sample through an ion mobility spectrometer to obtain an ion mobility spectrum, and analyzing at least other parts of the sample through a mass spectrometer to obtain a mass spectrum, wherein the period for obtaining each ion mobility spectrum and each mass spectrum being not longer than 5 s; and performing data post-processing, comprising: correlating the peaks in said ion mobility spectrum and the peaks in said mass spectrum with a deconvolution algorithm according to the consistency in retention time or elution profile for the same analyte in said chromatography.


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