The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 2018

Filed:

Feb. 27, 2015
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Shiun-Zu Kuo, Bothell, WA (US);

Thomas Reutter, Redmond, WA (US);

Yifan Gong, Sammamish, WA (US);

Mark T. Hanson, Woodinville, WA (US);

Ye Tian, Kenmore, WA (US);

Shuangyu Chang, Fremont, CA (US);

Jonathan Hamaker, Issaquah, WA (US);

Qi Miao, Kenmore, WA (US);

Yuancheng Tu, Issaquah, WA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G10L 15/01 (2013.01); G10L 15/183 (2013.01);
U.S. Cl.
CPC ...
G10L 15/01 (2013.01); G10L 15/183 (2013.01);
Abstract

Techniques and technologies for diagnosing speech recognition errors are described. In an example implementation, a system for diagnosing speech recognition errors may include an error detection module configured to determine that a speech recognition result is least partially erroneous, and a recognition error diagnostics module. The recognition error diagnostics module may be configured to (a) perform a first error analysis of the at least partially erroneous speech recognition result to provide a first error analysis result; (b) perform a second error analysis of the at least partially erroneous speech recognition result to provide a second error analysis result; and (c) determine at least one category of recognition error associated with the at least partially erroneous speech recognition result based on a combination of the first error analysis result and the second error analysis result.


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