The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 2018

Filed:

Jun. 30, 2016
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Jeffrey Kohler, Redmond, WA (US);

Shawn Crispin Wright, Sammamish, WA (US);

Jason Bradley Scott, Bellevue, WA (US);

John Copic, Redmond, WA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 17/00 (2006.01); G06T 19/00 (2011.01); G02B 27/01 (2006.01); G06T 19/20 (2011.01); G05B 19/42 (2006.01);
U.S. Cl.
CPC ...
G06T 17/00 (2013.01); G02B 27/017 (2013.01); G05B 19/4207 (2013.01); G06T 19/006 (2013.01); G06T 19/20 (2013.01); G06T 2200/04 (2013.01);
Abstract

Examples of providing feedback regarding a scan of a three-dimensional object are described. In one example, a method of computer modeling a three-dimensional object includes computer-tracking a three-dimensional pose of a scanning device relative to the three-dimensional object as the three-dimensional pose of the scanning devices changes to measure different contours of the three-dimensional object from different vantage points, and assessing a sufficiency of contour measurements from one or more of the different vantage points based on measurements received from the scanning device. The example method further includes providing haptic feedback, via a haptic output device, indicating the sufficiency of contour measurements corresponding to a current three-dimensional pose of the scanning device.


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