The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 2018

Filed:

Nov. 24, 2014
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Matthew Raphael Arnison, Umina Beach, AU;

Ernest Yiu Cheong Wan, Carlingford, AU;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/571 (2017.01);
U.S. Cl.
CPC ...
G06T 7/571 (2017.01); G06T 2207/10016 (2013.01); G06T 2207/10148 (2013.01); G06T 2207/20224 (2013.01);
Abstract

A method of determining a depth value of a fine structure pixel in a first image of a scene using a second image of the scene is disclosed. A gradient orientation for each of a plurality of fine structure pixels in the first image is determined. Difference images are generated from the second image and a series of blurred images formed from the first image, each difference image corresponding to one of a plurality of depth values. Each of the difference images is smoothed, in accordance with the determined gradient orientations, to generate smoothed difference images having increased coherency of fine structure. For each of a plurality of fine structure pixels in the first image, one of the smoothed difference images is selected. The depth value of the fine structure pixel corresponding to the selected smoothed difference image is determined.


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