The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2018
Filed:
Mar. 14, 2017
Hitomi Kaneko, Saitama, JP;
Hitomi Kaneko, Saitama, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
An examination device includes: a second difference image generator that calculates a difference in pixel values between each pixel constituting a detection target image and a pixel located away from the each pixel by a predetermined number of pixels in a first direction, and generates a second difference image constituted of the calculated difference values; a calculator that calculates a first pixel number being the number of pixels whose pixel values are more than a first threshold value, and a second pixel number being the number of pixels whose pixel values are less than the first threshold value, out of pixels constituting each pixel column constituting a detection target area in the second difference image extending in a second direction; and a determiner that determines whether there is a line defect in the detection target area based on ratio between the first and second pixel numbers of each pixel column.