The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2018
Filed:
Feb. 14, 2017
Cogniac, Corp., San Jose, CA (US);
William S Kish, Saratoga, CA (US);
Huayan Wang, Milpitas, CA (US);
Sandip C. Patel, San Jose, CA (US);
Yui Ming Tsang, Redwood City, CA (US);
Other;
Abstract
A computer system may train and use a machine-learning model to quantitatively analyze an image. In particular, the computer system may generate the machine-learning model based on a set of reference images that include content with instances of a quantitative feature attribute and one or more feedback metrics that specify locations of the instances of the quantitative feature attribute in the reference images and numerical values associated with the instances of the quantitative feature attribute. Then, after receiving the image from an electronic device, the computer system may analyze the image using the machine-learning model to perform measurements of one or more additional instances of the quantitative feature attribute in the image. Moreover, the computer system may provide a measurement result for the image, the measurement result including a second numerical value associated with the one or more additional instances of the quantitative feature attribute in the image.