The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2018
Filed:
Jul. 08, 2013
Panasonic Corporation, Osaka, JP;
Fumiaki Oobayashi, Osaka, JP;
Mikio Iwakawa, Osaka, JP;
Hiroshi Shimoda, Kyoto, JP;
Hirotake Ishii, Kyoto, JP;
Kazune Miyagi, Kyoto, JP;
Kotaro Oishi, Tokyo, JP;
Shutaro Kunimasa, Nara, JP;
Kosuke Uchiyama, Kyoto, JP;
Kyoichi Seo, Kyoto, JP;
Abstract
An intellectual-productivity analysis apparatus includes a presentation device, an input device, and an evaluation device. The presentation device presents a plurality of questions to a test subject. The input device allows the test subject input an answer to each question. The evaluation device includes a work memory part and an evaluating arithmetic part. The work memory part stores the answering time from a time when a question is presented on the presentation device to a time when the answer is inputted into the input device for each of the plurality of questions. The evaluating arithmetic part calculates an evaluation value on the intellectual productivity of the test subject during a measurement period of measuring the answering time of each of the plurality of questions by extracting a feature amount from the set of the answering time stored in the work memory part.