The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 2018

Filed:

Dec. 17, 2013
Applicant:

Olympus Corporation, Shibuya-ku, Tokyo, JP;

Inventor:

Kiyotomi Ogawa, Tokyo, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G01B 11/00 (2006.01); G01B 11/14 (2006.01); G06T 7/13 (2017.01); G06T 7/62 (2017.01); A61B 1/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/4633 (2013.01); G01B 11/002 (2013.01); G01B 11/14 (2013.01); G06T 7/13 (2017.01); G06T 7/62 (2017.01); A61B 1/00009 (2013.01); G06T 2207/10068 (2013.01); G06T 2207/30108 (2013.01);
Abstract

A region-setting unit sets, in an image, a region based on one reference point designated by a user in the image or a predetermined region as an extraction region. An edge extraction unit extracts an edge of the subject based on an image of the extraction region. When a plurality of edges are extracted, a display control unit causes a line indicating the plurality of extracted edges to be displayed on a display unit together with the image. An edge selection unit selects a reference edge from among the plurality of extracted edges based on an instruction from the user. A three-dimensional coordinate calculation unit calculates three-dimensional coordinates corresponding to points in the image. A reference line calculation unit calculates a reference line on a space based on the three-dimensional coordinates corresponding to points constituting the reference edge.


Find Patent Forward Citations

Ogawa, Kiyotomi. (2018). Measurement apparatus and program (U.S. Patent No. 10019643). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10019643

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…