The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2018
Filed:
Apr. 05, 2017
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;
Inventors:
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/08 (2016.01); G06F 12/0846 (2016.01); G06F 12/128 (2016.01); G06F 12/0844 (2016.01); G06F 12/0884 (2016.01);
U.S. Cl.
CPC ...
G06F 12/0846 (2013.01); G06F 12/0844 (2013.01); G06F 12/0884 (2013.01); G06F 12/128 (2013.01);
Abstract
A method includes outputting, at a processor, a command and an address to the memory module, receiving match/unmatch bits indicating results of comparing a tag corresponding to the address with tags stored in the memory module, from the memory module, determining, at the processor, a cache hit/miss from the match/unmatch bits by using majority voting, and outputting, at the processor, the determined cache hit/miss to the memory module.
O, Seongil. (2018). Memory module, computing system having the same, and method for testing tag error thereof (U.S. Patent No. 10019367). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10019367
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile