The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2018
Filed:
Feb. 05, 2016
Applicants:
Woonjae Chung, Gunpo-si, KR;
Hanshin Shin, Yongin-si, KR;
Inventors:
Woonjae Chung, Gunpo-si, KR;
HanShin Shin, Yongin-si, KR;
Assignee:
Samsung Electronics Co., Ltd., Gyeonggi-do, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 7/04 (2006.01); G06F 3/06 (2006.01); G11C 16/04 (2006.01); G11C 16/28 (2006.01); G11C 16/32 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0629 (2013.01); G06F 3/0604 (2013.01); G06F 3/0679 (2013.01); G11C 7/04 (2013.01); G11C 16/0483 (2013.01); G11C 16/28 (2013.01); G11C 16/32 (2013.01);
Abstract
In a method for operating a NAND flash memory system, a temperature sensing device detects a decrease in temperature of the NAND flash memory system below a first threshold temperature level, and a clock control unit adjusts an operating condition for a memory access operation in response to detecting the decrease in the temperature below the first threshold temperature level.
Chung, Woonjae. (2018). Storage devices, memory systems and operating methods to suppress operating errors due to variations in environmental conditions (U.S. Patent No. 10019188). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10019188
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile