The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2018
Filed:
Jan. 30, 2015
Shimadzu Corporation, Kyoto-shi, Kyoto, JP;
Akihiro Arai, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto-shi, Kyoto, JP;
Abstract
Resolution maps for size segments to which the size range of the measurement sample extends are retrieved. A high resolution region is extracted from the retrieved size segment resolution maps. After extracting the high resolution regions, the resolution maps are overlaid, the region where the high resolution regions overlap is taken as a high resolution overlap region, and the composition of a point within that high resolution overlap region is determined as the composition of a separation medium appropriate for separation of the measurement sample. The separation media A, B and C are mixed so as to achieve the determined composition, thereby preparing a mixed separation medium to be used for separation of the measurement sample.