The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 2018

Filed:

Oct. 16, 2017
Applicant:

Olympus Corporation, Tokyo, JP;

Inventor:

Masayuki Nakatsuka, Tokyo, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/367 (2013.01); G02B 21/362 (2013.01); G02B 21/361 (2013.01); G02B 21/368 (2013.01);
Abstract

A microscope system includes: a stage for placing a sample and movable in a direction; a position detecting unit that detects the stage position; an imaging unit that captures an image of the sample; an image generating unit that combines the acquired image based on the detected position; a position searching unit that searches for the position of an image on the generated combined image as the stage position; a switching detecting unit that detects switching of an optical member; and a control unit that corrects, when switching is detected, the stage position based on a difference between the stage position detected by the position detecting unit and the stage position searched by the position searching unit so that the stage position detected by the position detecting unit coincides with the stage position searched by the position searching unit.


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