The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 2018

Filed:

May. 27, 2015
Applicant:

Olympus Corporation, Shibuya-ku, Tokyo, JP;

Inventor:

Hirokazu Kubo, Higashimurayama, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G01N 21/64 (2006.01); G02B 21/06 (2006.01); G02B 21/16 (2006.01);
U.S. Cl.
CPC ...
G02B 21/361 (2013.01); G01N 21/6456 (2013.01); G02B 21/06 (2013.01); G02B 21/16 (2013.01); G01N 21/6458 (2013.01);
Abstract

By using a PPD as a detector, photon count loss is reduced to the utmost, and the incident light-intensity range in which light can be detected is widened. Provided is a laser microscope apparatus including an objective lens that collects return light from a specimen; a collimator lens that converts the return light collected by the objective lens into a substantially collimated beam, a PPD including a plurality of pixels that detect the return light converted to a substantially collimated beam by the collimator lens; and a controller that makes the beam diameter of the return light incident on the PPD substantially equal to an effective detection area of the PPD, formed by the plurality of pixels.


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