The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2018
Filed:
May. 15, 2008
Applicant:
Andreas G. Nowatzyk, San Jose, CA (US);
Inventor:
Andreas G. Nowatzyk, San Jose, CA (US);
Assignee:
PhotoNanoscopy Corporation, Sherman Oaks, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G02B 21/16 (2006.01); G02B 21/00 (2006.01); G02B 21/33 (2006.01); G02B 27/58 (2006.01); G02B 5/32 (2006.01); G02B 21/26 (2006.01); G02B 21/36 (2006.01); G02B 26/08 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0056 (2013.01); G02B 5/32 (2013.01); G02B 21/0072 (2013.01); G02B 21/0084 (2013.01); G02B 21/16 (2013.01); G02B 21/26 (2013.01); G02B 21/33 (2013.01); G02B 21/361 (2013.01); G02B 26/0808 (2013.01); G02B 26/0858 (2013.01); G02B 27/58 (2013.01);
Abstract
Described herein is a method and apparatus that may be used in various applications, such as medical diagnosis and conducting research. In one embodiment, the subject matter extends upon the principle of standing wave microscopy by improving the resolution of subject specimen images in all three dimensions, thus achieving near isotropic resolution improvement that allows full three dimensional imaging of the subject specimen beyond the optical resolution limits of the objective lens and without the complexity and cost associated with 4p microscopy.