The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2018
Filed:
Mar. 04, 2016
Aramco Services Company, Houston, TX (US);
Saudi Arabian Oil Company, Dhahran, SA;
Trustees of Boston University, Boston, MA (US);
Thomas Bifano, Mansfield, MA (US);
Shannon L. Eichmann, Somerville, MA (US);
Bennett B. Goldberg, Newton, MA (US);
Mazen Kanj, Dhahran, SA;
Hari P. Paudel, Boston, MA (US);
William Shain, Brookline, MA (US);
ARAMCO SERVICES COMPANY, Houston, TX (US);
SAUDI ARABIAN OIL COMPANY, , SA;
TRUSTEES OF BOSTON UNIVERSITY, Boston, MA (US);
Abstract
Embodiments of the invention provide an imaging system and method using adaptive optics and optimization algorithms for imaging through highly scattering media in oil reservoir applications and lab-based petroleum research. Two-/multi-photon fluorescence microscopy is used in conjunction with adaptive optics for enhanced imaging and detection capabilities in scattering reservoir media. Advanced fluorescence techniques are used to allow for super-penetration imaging to compensate for aberrations both in and out of the field of interest, extending the depth at which pore geometry can be imaged within a rock matrix beyond the current capability of confocal microscopy. The placement of a Deformable Mirror or Spatial Light Modulator for this application, in which scattering and index mismatch are dominant aberrations, is in an optical plane that is conjugate to the pupil plane of the objective lens in the imaging system.