The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 2018

Filed:

Feb. 24, 2014
Applicant:

Sharp Kabushiki Kaisha, Osaka-shi, Osaka, JP;

Inventors:

Shohei Katsuta, Osaka, JP;

Yasushi Asaoka, Osaka, JP;

Hideomi Yui, Osaka, JP;

Tsuyoshi Maeda, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02F 1/1335 (2006.01); G02B 5/02 (2006.01);
U.S. Cl.
CPC ...
G02B 5/0247 (2013.01); G02B 5/0242 (2013.01); G02B 5/0278 (2013.01); G02F 1/133504 (2013.01); G02F 1/133512 (2013.01); G02F 2001/133562 (2013.01);
Abstract

This light diffusion member includes: a substrate having light transmissivity; a plurality of light shielding layers formed on one face of the substrate; and light diffusion portions formed on the one face of the substrate at regions other than the regions where the light shielding layers have been formed. The light diffusion portions have a light-emitting end surface coming into contact with the substrate, a light incident end surface which faces the light-emitting end surface and has a larger area than the area of the light-emitting end surface, and a reflecting face coming into contact with the light-emitting end surface and the light incident end surface, and reflecting light entering from the light incident end surface. The height from the light incident end surface to the light-emitting end surface of the light diffusion portion is greater than the thickness of the light shielding layers. A scattering intensity at an azimuth ϕ+Δϕ and a scattering intensity at an azimuth ϕ−Δϕ across a strong scattering azimuth ϕas a center axis are generally the same.


Find Patent Forward Citations

Loading…