The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 2018

Filed:

May. 21, 2014
Applicant:

Oxford Instruments Nanotechnology Tools Limited, Oxon, GB;

Inventor:

Peter Statham, Oxon, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/36 (2006.01); G01T 1/17 (2006.01);
U.S. Cl.
CPC ...
G01T 1/36 (2013.01); G01T 1/171 (2013.01);
Abstract

A method is provided for processing a spectrum, obtained using a particle detection system, so as to reduce spectrum artifacts arising from unresolved particle events in the detection system. An input spectrum is obtained which contains artifacts due to 'pile up' in the detector. A first effect upon the input spectrum of pairs of unresolved particle events is evaluated and a first corrected input spectrum is generated which comprises the input spectrum with the first effect removed. The effect of a pairs of unresolved particle events is then evaluated for this first corrected input spectrum so as to generate a second corrected input spectrum which comprises the input spectrum with the second effect removed. An output spectrum is then generated based upon a combination of the first and second corrected input spectra. The use of the method in improving sum spectra is also discussed.


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