The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 2018

Filed:

Aug. 04, 2015
Applicant:

Rohde & Schwarz Gmbh & Co.kg, Munich, DE;

Inventors:

Andreas Lagler, Rosenheim, DE;

Clemens Lohmer, Dachau, DE;

Luke Cirillo, Poing, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/40 (2006.01); G01S 13/34 (2006.01);
U.S. Cl.
CPC ...
G01S 7/4004 (2013.01); G01S 7/4008 (2013.01); G01S 13/345 (2013.01);
Abstract

A measuring device for measuring a measurement signal of a device under test comprises a processing unit and a display unit. The processing unit comprises a detection unit configured to automatically determine at least one parameter characterizing the measurement signal. The processing unit further comprises a reconstruction unit configured to reconstruct an ideal measurement signal on the basis of the at least one parameter characterizing the measurement signal. The display unit is configured to display the measurement signal or a signal derived from the measurement signal and the reconstructed ideal measurement signal.


Find Patent Forward Citations

Lagler, Andreas. (2018). Measuring device and a measuring method especially for the measurement of fmcw signals (U.S. Patent No. 10018708). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10018708

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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