The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2018
Filed:
Dec. 05, 2014
Shenzhen Institutes of Advanced Technology Chinese Academy of Sciences, Shenzhen, CN;
Xi Peng, Shenzhen, CN;
Dong Liang, Shenzhen, CN;
Xin Liu, Shenzhen, CN;
Hairong Zheng, Shenzhen, CN;
Shenzhen Institutes Of Advanced Technology Chinese Academy Of Sciences, Shenzhen, Guangdong, CN;
Abstract
Disclosed is a magnetic resonance rapid parameter imaging method and system. The method comprises: obtaining a target undersampled magnetic resonance signal (S); obtaining prior information of a parameter model (S); performing sequence reconstruction of a target image according to the undersampled magnetic resonance signal and the prior information to obtain a target image sequence (S); and substituting the target image sequence into the parameter estimation model to obtain object parameters and to generate parametric images (S).