The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2018
Filed:
Mar. 14, 2014
Altera Corporation, San Jose, CA (US);
Adam Titley, Bracknell, GB;
Roger May, Deddington, GB;
Altera Corporation, San Jose, CA (US);
Abstract
A programmable integrated circuit may implement a safety function in a first region and a non-safety function in a second region of the programmable integrated circuit. The safety function may require that periodic tests verify the integrity of the programmable integrated circuit during safety test intervals. For this purpose, the programmable integrated circuit may halt the operation of the safety function, partially reconfigure the first region by loading a test function, and execute the test function, while the non-safety function in the second region continues to operate. In the event that the test function executed successfully without finding any defects, the programmable integrated circuit may partially reconfigure the first region by re-loading the safety function. Additional tests may be performed if the test function detected problems with the integrity of the programmable integrated circuit.