The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2018
Filed:
May. 03, 2016
Applicant:
Ikonisys, Inc., New Haven, CT (US);
Inventors:
Young Min Kim, Palo Alto, CA (US);
Yanning Zhu, Hamden, CT (US);
Yash Agarwal, New Haven, CT (US);
Xiuzhong Wang, Hamden, CT (US);
Aaron Armstrong, Stamford, CT (US);
Robert Borgerding, New Haven, CT (US);
Andrew Macginitie, Roxbury, CT (US);
Antti Seppo, New York, NY (US);
Ilia Ichetovkin, Hamden, CT (US);
Michael Kilpatrick, West Hartford, CT (US);
Petros Tsipouras, Madison, CT (US);
Triantafyllos P. Tafas, Rocky Hill, CT (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G01N 35/00 (2006.01); G01J 3/28 (2006.01); G01J 3/44 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00732 (2013.01); G01N 21/6428 (2013.01); G01N 21/6458 (2013.01); G01J 3/2803 (2013.01); G01J 3/4406 (2013.01); G01N 2021/6419 (2013.01); G01N 2021/6421 (2013.01); G01N 2021/6439 (2013.01); G01N 2021/6441 (2013.01); G01N 2021/6482 (2013.01); G01N 2035/00851 (2013.01); G01N 2201/06113 (2013.01); G01N 2201/12 (2013.01);
Abstract
A method for automated microscopic analysis wherein the test protocol is obtained from interrogatable data affixed to each microscope slide. The method further comprises the algorithms that implement the test protocol.