The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2018
Filed:
Jan. 24, 2013
Applicant:
Denka Seiken Co., Ltd., Tokyo, JP;
Inventors:
Assignee:
DENKA SEIKEN CO., LTD., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/92 (2006.01); C12Q 1/60 (2006.01); G01N 33/00 (2006.01);
U.S. Cl.
CPC ...
G01N 33/92 (2013.01); C12Q 1/60 (2013.01);
Abstract
Disclosed is the provision of a method for quantifying HDL3 in a test sample without requiring a laborious operation. The method for quantifying cholesterol in high-density lipoprotein 3 comprises allowing a surfactant(s) which specifically react(s) with a high-density lipoprotein 3 to react with a test sample and quantifying cholesterol, and the surfactant(s) is(are) at least one selected from the group consisting of polyoxyethylene polycyclic phenyl ether and polyoxyethylene styrenated phenyl ether.