The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2018
Filed:
Oct. 27, 2014
Shimadzu Corporation, Kyoto-shi, Kyoto, JP;
Aichi Prefectural Government, Nagoya-shi, Aichi, JP;
SHIMADZU CORPORATION, Kyoto-shi, Kyoto, JP;
AICHI PREFECTURAL GOVERNMENT, Nagoya-shi, Aichi, JP;
Abstract
A number of analytes are divided into groups based on at least either the elution position determined by silica gel column chromatography under the same condition or the partition ratio in a hexane-acetonitrile partition method. To each group, a compound obtained by labeling one of the compounds in the group by deuterium and/or carbon is assigned as the surrogate. After those surrogates are added as internal standard substances to a standard sample for the creation of calibration curves, a GC/MS analysis for the sample is performed and a calibration curve is created for each analyte. In the measurement of an unknown sample, the same set of surrogates are added to the sample and the GC/MS analysis is performed. A quantitative determination processor determines the quantity of each analyte by comparing a peak area ratio calculated from the analysis result with a calibration curve read from the database.