The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 2018

Filed:

Apr. 04, 2016
Applicant:

National Security Technologies, Llc, Las Vegas, NV (US);

Inventor:

Jeffrey A. Koch, Livermore, CA (US);

Assignee:

Mission Support and Tests Services, LLC, North Las Vegas, NV (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G21K 1/06 (2006.01); G01N 23/207 (2018.01);
U.S. Cl.
CPC ...
G01N 23/2076 (2013.01); G21K 2201/062 (2013.01);
Abstract

A method and apparatus for imaging the distribution of bulk motional velocities in plasmas such as inertial confinement fusion (ICF) implosions. This method and apparatus use multiple narrow-band x-ray crystal imaging systems, one or more of which have a bandpass tuned to lie within the Doppler-broadened emission line profile of a suitable plasma emission line. Crystals tuned on the one end of the profile will preferentially reflect x-rays from plasma ions moving towards the crystals, while crystals tuned to another end of the profile will preferentially reflect x-rays from plasma ions moving away from the crystals.


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